DocumentCode
1245628
Title
Terrain height measurement accuracy of interferometric synthetic aperture radars
Author
Mrstik, Vincent ; VanBlaricum, Glenn, Jr. ; Cardillo, Gerard ; Fennell, Mark
Author_Institution
Toyon Res. Corp., Goleta, CA, USA
Volume
34
Issue
1
fYear
1996
fDate
1/1/1996 12:00:00 AM
Firstpage
219
Lastpage
228
Abstract
Presents a simple expression for the accuracy with which an interferometer synthetic-aperture radar (IFSAR) can measure terrain elevation. The expression, derived analytically and confirmed by Monte Carlo simulation, accounts for thermal noise, resolution cell size, terrain slope and roughness, volume scattering above the terrain, radar-terrain geometry, interferometer baseline, and radar frequency. This paper takes a “glint” approach to assessing the impact of scatterers distributed in angle. The results show that there is a residual uncertainty in the height of a pixel due to its angular extent, even when the signal-to-noise ratio is very large. The analysis identifies an optimum range resolution for minimizing the height uncertainty for a particular terrain slope
Keywords
cartography; geophysical techniques; radar applications; radar imaging; remote sensing by radar; synthetic aperture radar; topography (Earth); IFSAR; Monte Carlo simulation; SAR imaging; analytical expression; geophysical measurement technique; height uncertainty; interferometric SAR; land surface topography; optimum range resolution; radar remote sensing; radar-terrain geometry; synthetic aperture radar; terrain elevation; terrain height measurement accuracy; terrain mapping; terrain slope; Filtering; Geometry; Optical scattering; Radar antennas; Radar imaging; Radar measurements; Radar scattering; Synthetic aperture radar; Synthetic aperture radar interferometry; Uncertainty;
fLanguage
English
Journal_Title
Geoscience and Remote Sensing, IEEE Transactions on
Publisher
ieee
ISSN
0196-2892
Type
jour
DOI
10.1109/36.481906
Filename
481906
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