Title :
Terrain height measurement accuracy of interferometric synthetic aperture radars
Author :
Mrstik, Vincent ; VanBlaricum, Glenn, Jr. ; Cardillo, Gerard ; Fennell, Mark
Author_Institution :
Toyon Res. Corp., Goleta, CA, USA
fDate :
1/1/1996 12:00:00 AM
Abstract :
Presents a simple expression for the accuracy with which an interferometer synthetic-aperture radar (IFSAR) can measure terrain elevation. The expression, derived analytically and confirmed by Monte Carlo simulation, accounts for thermal noise, resolution cell size, terrain slope and roughness, volume scattering above the terrain, radar-terrain geometry, interferometer baseline, and radar frequency. This paper takes a “glint” approach to assessing the impact of scatterers distributed in angle. The results show that there is a residual uncertainty in the height of a pixel due to its angular extent, even when the signal-to-noise ratio is very large. The analysis identifies an optimum range resolution for minimizing the height uncertainty for a particular terrain slope
Keywords :
cartography; geophysical techniques; radar applications; radar imaging; remote sensing by radar; synthetic aperture radar; topography (Earth); IFSAR; Monte Carlo simulation; SAR imaging; analytical expression; geophysical measurement technique; height uncertainty; interferometric SAR; land surface topography; optimum range resolution; radar remote sensing; radar-terrain geometry; synthetic aperture radar; terrain elevation; terrain height measurement accuracy; terrain mapping; terrain slope; Filtering; Geometry; Optical scattering; Radar antennas; Radar imaging; Radar measurements; Radar scattering; Synthetic aperture radar; Synthetic aperture radar interferometry; Uncertainty;
Journal_Title :
Geoscience and Remote Sensing, IEEE Transactions on