Title :
Statistical shape analysis: clustering, learning, and testing
Author :
Srivastava, Anuj ; Joshi, Shantanu H. ; Mio, Washington ; Liu, Xiuwen
Author_Institution :
Dept. of Stat., Florida State Univ., Tallahassee, FL, USA
fDate :
4/1/2005 12:00:00 AM
Abstract :
Using a differential-geometric treatment of planar shapes, we present tools for: 1) hierarchical clustering of imaged objects according to the shapes of their boundaries, 2) learning of probability models for clusters of shapes, and 3) testing of newly observed shapes under competing probability models. Clustering at any level of hierarchy is performed using a minimum variance type criterion and a Markov process. Statistical means of clusters provide shapes to be clustered at the next higher level, thus building a hierarchy of shapes. Using finite-dimensional approximations of spaces tangent to the shape space at sample means, we (implicitly) impose probability models on the shape space, and results are illustrated via random sampling and classification (hypothesis testing). Together, hierarchical clustering and hypothesis testing provide an efficient framework for shape retrieval. Examples are presented using shapes and images from ETH, Surrey, and AMCOM databases.
Keywords :
Markov processes; image processing; pattern clustering; statistical analysis; Markov process; differential-geometric treatment; finite-dimensional approximations; hierarchical clustering; minimum variance type criterion; statistical shape analysis; Application software; Computer vision; Data analysis; Data mining; Image analysis; Image databases; Probability; Shape; Statistical analysis; Testing; Index Terms- Shape analysis; shape clustering.; shape learning; shape retrieval; shape statistics; shape testing; Algorithms; Artificial Intelligence; Cluster Analysis; Computer Simulation; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Models, Biological; Models, Statistical; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.86