Title :
Edge and corner detection by photometric quasi-invariants
Author :
van de Weijer, Joost ; Gevers, Theo ; Geusebroek, Jan-Mark
Author_Institution :
Fac. of Sci., Amsterdam Univ., Netherlands
fDate :
4/1/2005 12:00:00 AM
Abstract :
Feature detection is used in many computer vision applications such as image segmentation, object recognition, and image retrieval. For these applications, robustness with respect to shadows, shading, and specularities is desired. Features based on derivatives of photometric invariants, which we is called full invariants, provide the desired robustness. However, because computation of photometric invariants involves nonlinear transformations, these features are unstable and, therefore, impractical for many applications. We propose a new class of derivatives which we refer to as quasi-invariants. These quasi-invariants are derivatives which share with full photometric invariants the property that they are insensitive for certain photometric edges, such as shadows or specular edges, but without the inherent instabilities of full photometric invariants. Experiments show that the quasi-invariant derivatives are less sensitive to noise and introduce less edge displacement than full invariant derivatives. Moreover, quasi-invariants significantly outperform the full invariant derivatives in terms of discriminative power.
Keywords :
computer vision; edge detection; feature extraction; photometry; computer vision; corner detection; edge detection; nonlinear transformations; photometric edges; photometric quasi-invariants; Application software; Computer vision; Image edge detection; Image retrieval; Image segmentation; Object detection; Object recognition; Optical reflection; Photometry; Robustness; Index Terms- Edge and feature detection; color.; invariants; Algorithms; Artificial Intelligence; Image Enhancement; Image Interpretation, Computer-Assisted; Information Storage and Retrieval; Pattern Recognition, Automated; Photometry; Reproducibility of Results; Sensitivity and Specificity;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2005.75