• DocumentCode
    1245914
  • Title

    Thin film transfer process for low cost MCM-D fabrication

  • Author

    Narayan, C. ; Purushothaman, S. ; Doany, F. ; Deutsch, A.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    18
  • Issue
    1
  • fYear
    1995
  • fDate
    2/1/1995 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    46
  • Abstract
    This paper describes a unique, highly flexible cost competitive method to fabricate microelectronic packages that require thin film interconnections. The method involves fabricating thin film metal/polymer structures multi-up on a reusable temporary glass carrier; the thin film stack is transferred later onto product substrates of choice. The final product substrate can be silicon, co-fired alumina or glass-ceramic, aluminum nitride, diamond, or a printed wiring board. Optionally, one can also use the released thin film decal as a flexible high wireability interconnect by itself, as an interposer, or in applications like wafer level testing for known good die (KGD). The thin film wiring structure can be fabricated multi-up on a standardized form factor carrier (independent of the characteristics of the final product substrate) in a thin film interconnect foundry, thus significantly reducing cost both from the economies of scale and full utilization of the thin film factory for a variety of customer needs
  • Keywords
    economics; flexible manufacturing systems; integrated circuit interconnections; integrated circuit manufacture; integrated circuit packaging; multichip modules; Al2O3; AlN; C; Si; aluminum nitride; co-fired alumina; diamond; form factor carrier; glass-ceramic; high wireability interconnect; interposer; known good die; low cost MCM-D fabrication; metal/polymer structures; microelectronic packages; printed wiring board; product substrates; released thin film decal; reusable temporary glass carrier; thin film interconnect foundry; thin film interconnections; thin film transfer process; wafer level testing; Costs; Fabrication; Glass; Microelectronics; Packaging; Polymer films; Silicon; Substrates; Transistors; Wiring;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9894
  • Type

    jour

  • DOI
    10.1109/96.365481
  • Filename
    365481