Comparison of ultralow-sidelobe-antenna far-field patterns using the planar-near-field method and the far-field method

Author

Francis, Michael H. ; Newell, Allen C. ; Grimm, Keizizetli R. ; Hoffman, John ; Schrank, H.E.

Author_Institution

Nat. Inst. of Stand. & Technol., Boulder, CO, USA

Volume

37

Issue

6

fYear

1995

fDate

12/1/1995 12:00:00 AM

Firstpage

7

Lastpage

15

Abstract

The development of very-low-sidelobe antennas raises the question of whether or not the planar-near-field method can be used to accurately measure these antennas. Previously, scientists at several organizations showed that data taken and processed with the planar-near-field methodology, including probe correction, can be used to accurately measure the sidelobes of very-low-sidelobe antennas. This can be done to levels of -55 dB to -60 dB, relative to the main-beam peak. The present paper highlights these results, including a comparison of the far field, from the planar-near-field method, with the far field, found on a far-field range. The test antenna for the study was a slotted-waveguide array, the low sidelobes for which were known. The near-field measurements were conducted on the NIST planar-near-field facility

Keywords

antenna radiation patterns; antenna testing; slot antenna arrays; far-field method; planar-near-field method; slotted-waveguide array; test antenna; ultralow-sidelobe-antenna far-field patterns; very-low-sidelobe antennas; Antenna arrays; Antenna measurements; Antenna theory; Antennas and propagation; Azimuth; Loaded antennas; NIST; Slot antennas; Springs; Testing;

fLanguage

English

Journal_Title

Antennas and Propagation Magazine, IEEE

Publisher

ieee

ISSN

1045-9243

Type

jour

DOI

10.1109/74.482028

Filename

482028