• DocumentCode
    1246045
  • Title

    HyHOPE: fast fault simulator with efficient simulation of hypertrophic faults

  • Author

    Kung, C.-P. ; Lin, C.-S.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    142
  • Issue
    1
  • fYear
    1995
  • fDate
    2/1/1995 12:00:00 AM
  • Firstpage
    53
  • Lastpage
    60
  • Abstract
    In sequential circuit fault simulation, hypertrophic faults, which result from lengthened initialisation sequence in faulty circuits, usually produce a large number of fault events during simulation and require excessive gate evaluations. These faults degrade the performance of fault simulators attempting to simulate them exactly. In the paper, an exact simulation algorithm is developed to identify hypertrophic faults and to minimise their effects during fault simulation. The simulator HyHOPE, based on this algorithm, shows that the average speed-up ratio over HOPE for test vectors generated by STG3 is 1.65. Furthermore, the results indicate that the performance of HyHOPE is close to the approximate simulator, in which hypertrophic faults are simply dropped when they become potentially detected
  • Keywords
    VLSI; circuit analysis computing; digital simulation; fault location; integrated logic circuits; logic testing; sequential circuits; HyHOPE; average speed-up ratio; fast fault simulator; hypertrophic faults; lengthened initialisation sequence; sequential circuit; simulation algorithm;
  • fLanguage
    English
  • Journal_Title
    Circuits, Devices and Systems, IEE Proceedings -
  • Publisher
    iet
  • ISSN
    1350-2409
  • Type

    jour

  • DOI
    10.1049/ip-cds:19951623
  • Filename
    365550