DocumentCode
1246045
Title
HyHOPE: fast fault simulator with efficient simulation of hypertrophic faults
Author
Kung, C.-P. ; Lin, C.-S.
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
142
Issue
1
fYear
1995
fDate
2/1/1995 12:00:00 AM
Firstpage
53
Lastpage
60
Abstract
In sequential circuit fault simulation, hypertrophic faults, which result from lengthened initialisation sequence in faulty circuits, usually produce a large number of fault events during simulation and require excessive gate evaluations. These faults degrade the performance of fault simulators attempting to simulate them exactly. In the paper, an exact simulation algorithm is developed to identify hypertrophic faults and to minimise their effects during fault simulation. The simulator HyHOPE, based on this algorithm, shows that the average speed-up ratio over HOPE for test vectors generated by STG3 is 1.65. Furthermore, the results indicate that the performance of HyHOPE is close to the approximate simulator, in which hypertrophic faults are simply dropped when they become potentially detected
Keywords
VLSI; circuit analysis computing; digital simulation; fault location; integrated logic circuits; logic testing; sequential circuits; HyHOPE; average speed-up ratio; fast fault simulator; hypertrophic faults; lengthened initialisation sequence; sequential circuit; simulation algorithm;
fLanguage
English
Journal_Title
Circuits, Devices and Systems, IEE Proceedings -
Publisher
iet
ISSN
1350-2409
Type
jour
DOI
10.1049/ip-cds:19951623
Filename
365550
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