DocumentCode :
1246138
Title :
Test and measurement
Author :
Riezenman, M.J.
Volume :
32
Issue :
1
fYear :
1995
fDate :
1/1/1995 12:00:00 AM
Firstpage :
52
Lastpage :
55
Abstract :
The author discusses the latest developments in test and measurement technology including: IDDQ testing, its benefits and disadvantages; pay-per-use testers in which a button is inserted in a fully configured system and programmed with test credits which must be purchased in advance; digital oscilloscopes; and Hewlett Packard´s entry into the VXIplug and play Systems Alliance
Keywords :
automatic test equipment; digital storage oscilloscopes; Hewlett Packard; IDDQ testing; VXIplug and play Systems Alliance; digital oscilloscopes; measurement technology; pay-per-use testers; test technology; Automatic testing; Circuit faults; Circuit testing; Fault detection; Instruments; Integrated circuit testing; Logic testing; Semiconductor device testing; Software testing; System testing;
fLanguage :
English
Journal_Title :
Spectrum, IEEE
Publisher :
ieee
ISSN :
0018-9235
Type :
jour
DOI :
10.1109/6.366241
Filename :
366241
Link To Document :
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