DocumentCode :
1246381
Title :
Thermal investigation of high power Optical Devices by transient testing
Author :
Farkas, Gábor ; Vader, Qv.V. ; Poppe, András ; Bognár, György
Volume :
28
Issue :
1
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
45
Lastpage :
50
Abstract :
In case of opto-electronic devices, the power applied on the device leaves in a parallel heat and light transport, the interpretation of Rth is not obvious. The paper shows results of a combined optical and thermal measurement for the characterization of power light emitting diodes (LEDs). A model explaining Rth changes at different current levels is proposed.
Keywords :
integrated optoelectronics; light emitting diodes; thermal analysis; thermo-optical devices; transient analysis; high power optical devices; light transport; optical measurement; optoelectronic devices; parallel heat transport; power light emitting diodes; thermal measurement; transient testing; Cooling; Electrical resistance measurement; Light emitting diodes; Optical devices; Optoelectronic devices; Power measurement; Silicon; Temperature; Testing; Thermal resistance; Light emitting diodes (LEDs); opto-electronic devices; thermal measurement;
fLanguage :
English
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3331
Type :
jour
DOI :
10.1109/TCAPT.2004.843197
Filename :
1402611
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1246381
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