Title :
Scattering parameter and bit error rate characterization of high temperature superconducting coplanar transmission lines
Author :
Kruse, J. ; Chang, W.H. ; Scherrer, D. ; Gao, F. ; Feng, M. ; Scharen, M. ; Cardona, A. ; Forse, R.
Author_Institution :
Sci. & Technol. Center for Superconductivity, Illinois Univ., Urbana, IL, USA
Abstract :
We report the gigahertz experimental results of time and frequency performance on YBCO high temperature superconductor (HTS) and gold coplanar transmission lines. An on-wafer direct probing measurement system was used to collect data at cryogenic temperatures on both YBCO and gold coplanar lines. The insertion loss of the 6-cm lines at a frequency of 3.0 GHz was measured to be -0.12 dB for the superconducting line compared to -10.7 dB for the gold line at 80 K. Error rate and eye-diagram measurements were performed on the packaged lines and show the correlation between the insertion loss of the line and the attenuation of a Pseudo Random Bit Sequence (PBRS). The superconducting line measured at 77 K had a BER rate of less than 10/sup -11/ at a data rate of 3 Gb/s. The measured eye height was 350 mV for the YBCO compared to 100 mV for a gold line at 3 Gb/s and a temperature of 77 K for the packaged 6-cm lines.
Keywords :
S-parameters; barium compounds; error statistics; high-temperature superconductors; losses; superconducting microwave devices; telecommunication transmission lines; yttrium compounds; 0.12 dB; 10.7 dB; 3 Gbit/s; 3.0 GHz; 6 cm; 77 K; 80 K; Au; YBCO; YBaCuO; attenuation; bit error rate; cryogenic temperatures; eye height; eye-diagram; gold; high temperature superconducting coplanar transmission lines; insertion loss; on-wafer direct probing measurement; packaged lines; pseudo random bit sequence; scattering parameter; Attenuation measurement; Bit error rate; Frequency measurement; Gold; High temperature superconductors; Insertion loss; Loss measurement; Scattering parameters; Transmission line measurements; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on