Title :
Prediction of stress-strain relationship with an improved Anand constitutive Model For lead-free solder Sn-3.5Ag
Author :
Chen, Xu ; Chen, Gang ; Sakane, Masao
Author_Institution :
Sch. of Chem. Eng. & Technol., Tianjin Univ., China
fDate :
3/1/2005 12:00:00 AM
Abstract :
An improved Anand constitutive model is proposed to describe the inelastic deformation of lead-free solder Sn-3.5Ag used in solder joints of microelectronic packaging. The new model accurately predicted the overall trend of steady-state stress-strain behavior of the solder for the temperature range from 233 K to 398 K and the strain rate range from 0.005 s-1 to 0.1 s-1. h0, a constant in the original Anand model, was set to a function of temperature and strain rate in the proposed model. Comparison of the experimental results and simulated results verified that the improved Anand model with modifying h0 to a function reasonably simulated the inelastic stress-strain relationships.
Keywords :
elastic deformation; electronics packaging; reliability; solders; stress-strain relations; tin alloys; 233 to 398 K; SnAg; improved anand constitutive model; inelastic deformation; inelastic stress-strain relationship; lead-free solder; microelectronic packaging; solder joints; Capacitive sensors; Deformable models; Environmentally friendly manufacturing techniques; Lead; Microelectronics; Packaging; Predictive models; Soldering; Steady-state; Temperature distribution; Anand model; Sn-3.5Ag; constitutive model; lead-free solder;
Journal_Title :
Components and Packaging Technologies, IEEE Transactions on
DOI :
10.1109/TCAPT.2004.843157