• DocumentCode
    1246426
  • Title

    Correlation of material properties to reliability performance of anisotropic conductive adhesive flip chip packages

  • Author

    Teo, Mary ; Mhaisalkar, Subodh G. ; Wong, E.H. ; Poi-Siong Teo ; Wong, C.C. ; Ong, Kristine ; Goh, Chin Foo ; Teh, Lay Kuan

  • Author_Institution
    Assembly & Interconnect Technol. Dept., Infineon Technol. Asia Pacific Pte. Ltd., Singapore, Singapore
  • Volume
    28
  • Issue
    1
  • fYear
    2005
  • fDate
    3/1/2005 12:00:00 AM
  • Firstpage
    157
  • Lastpage
    164
  • Abstract
    The anisotropic conductive adhesive (ACA) is a promising solder alternative candidate that shows potential for further pitch reduction. Although much work has been published on ACA joint behavior, study on correlation of material properties with reliability performance is still lacking. The main objective in this study was to identify the impact of material properties on reliability, so as to engineer highly reliable microelectronics assemblies. Four representative ACA materials (both film and paste types) with diverse properties were selected. Material properties were characterized as close as possible to "stress test" conditions so as to allow more accurate correlation predictions. Reliability performance was obtained by assembling test chips of 200-μm pitch onto BT-substrates, then subjecting them to reliability tests. Correlation analysis was conducted and key material properties that contributed to good reliability performance were identified. Findings indicated that the best properties for high reliability assemblies were: high adhesion strength after subjecting to "stress aging", low coefficient of moisture expansion (CME) and low elastic modulus (E).
  • Keywords
    adhesives; correlation methods; flip-chip devices; materials properties; reliability; stress analysis; 200 micron; ACA joint behavior; adhesive interconnection; anisotropic conductive adhesive flip chip packages; correlation analysis; elastic modulus; material properties; microelectronics assemblies; moisture expansion; pitch reduction; reliability performance; reliability tests; stress test; Anisotropic magnetoresistance; Assembly; Conductive adhesives; Flip chip; Material properties; Materials reliability; Packaging; Reliability engineering; Stress; Testing; Adhesive interconnection; anisotropic conductive adhesives (ACAs); correlation; flip chip; reliability;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/TCAPT.2004.843175
  • Filename
    1402626