DocumentCode
1246714
Title
Silicon bipolar device structures for digital applications: technology trends and future directions
Author
Warnock, James D.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume
42
Issue
3
fYear
1995
fDate
3/1/1995 12:00:00 AM
Firstpage
377
Lastpage
389
Abstract
The double-polysilicon self-aligned bipolar device structure has come a long way since its first inception, but there is still room for further scaling of this structure and continued improvements in performance. An analysis of the current state-of-the-art double-poly structure leads naturally to a discussion of future trends and technologies necessary to continue scaling into the sub-0.25 μm regime. In addition, it has become highly desirable to extend bipolar processes in new directions to take advantage of the opportunities offered by emerging materials technologies, such as bonded silicon-on-insulator films and medium or low temperature Si and SiGe epitaxy. Opportunities also exist for high-performance bipolars in BiCMOS technology and in complementary bipolar processes for low-power, high-speed digital applications. These extensions beyond “conventional” bipolar technology will be discussed in terms of their requirements and the device structures that are evolving to match these needs
Keywords
bipolar transistors; semiconductor technology; silicon; technological forecasting; 0.25 micron; BiCMOS technology; Si; SiGe; bonded silicon-on-insulator films; complementary bipolar processes; double-polysilicon self-aligned bipolar device structure; low temperature epitaxy; low-power high-speed digital applications; medium temperature epitaxy; scaling; technology trends; BiCMOS integrated circuits; Bipolar transistors; Bonding; Germanium silicon alloys; Materials science and technology; Paper technology; Parasitic capacitance; Silicon germanium; Silicon on insulator technology; Very large scale integration;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.368033
Filename
368033
Link To Document