• DocumentCode
    1246714
  • Title

    Silicon bipolar device structures for digital applications: technology trends and future directions

  • Author

    Warnock, James D.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
  • Volume
    42
  • Issue
    3
  • fYear
    1995
  • fDate
    3/1/1995 12:00:00 AM
  • Firstpage
    377
  • Lastpage
    389
  • Abstract
    The double-polysilicon self-aligned bipolar device structure has come a long way since its first inception, but there is still room for further scaling of this structure and continued improvements in performance. An analysis of the current state-of-the-art double-poly structure leads naturally to a discussion of future trends and technologies necessary to continue scaling into the sub-0.25 μm regime. In addition, it has become highly desirable to extend bipolar processes in new directions to take advantage of the opportunities offered by emerging materials technologies, such as bonded silicon-on-insulator films and medium or low temperature Si and SiGe epitaxy. Opportunities also exist for high-performance bipolars in BiCMOS technology and in complementary bipolar processes for low-power, high-speed digital applications. These extensions beyond “conventional” bipolar technology will be discussed in terms of their requirements and the device structures that are evolving to match these needs
  • Keywords
    bipolar transistors; semiconductor technology; silicon; technological forecasting; 0.25 micron; BiCMOS technology; Si; SiGe; bonded silicon-on-insulator films; complementary bipolar processes; double-polysilicon self-aligned bipolar device structure; low temperature epitaxy; low-power high-speed digital applications; medium temperature epitaxy; scaling; technology trends; BiCMOS integrated circuits; Bipolar transistors; Bonding; Germanium silicon alloys; Materials science and technology; Paper technology; Parasitic capacitance; Silicon germanium; Silicon on insulator technology; Very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.368033
  • Filename
    368033