DocumentCode
1246727
Title
Self-aligned complementary bipolar technology for low-power dissipation and ultra-high-speed LSIs
Author
Onai, Takahiro ; Ohue, Eiji ; Idei, Yohji ; Tanabe, Masamichi ; Shimamoto, Hiromi ; Washio, Katsuyoshi ; Nakamura, Tohru
Author_Institution
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume
42
Issue
3
fYear
1995
fDate
3/1/1995 12:00:00 AM
Firstpage
413
Lastpage
418
Abstract
Fully symmetrical complementary bipolar transistors for low power-dissipation and ultra-high-speed LSIs have been integrated in the same chip using a 0.3-μm SPOTEC process. Reducing the surface concentration of the boron by oxidation at the surface of the boron diffusion layer suppressed the upward diffusion of boron from the subcollector of the pnp transistor during epitaxial growth. This enabled thin epitaxial layer growth for both npn and pnp transistors simultaneously. Cutoff frequencies of 30 and 32 GHz were obtained in npn and pnp transistors, respectively. Simulated results showed that the power dissipation is reduced to 1/5 in a complementary active pull-down circuit compared with an ECL circuit
Keywords
bipolar integrated circuits; diffusion; epitaxial growth; integrated circuit technology; large scale integration; oxidation; very high speed integrated circuits; 0.3 micron; 30 GHz; 32 GHz; SPOTEC process; Si:B; active pull-down circuit; boron diffusion layer; cutoff frequencies; epitaxial growth; npn transistor; oxidation; pnp transistor; power dissipation; self-aligned complementary bipolar technology; simulation; surface boron concentration; ultra-high-speed LSIs; Bipolar transistors; Boron; Circuits; Cutoff frequency; Delay; Epitaxial growth; Large scale integration; Oxidation; Power dissipation; Switches;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.368037
Filename
368037
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