DocumentCode :
1246727
Title :
Self-aligned complementary bipolar technology for low-power dissipation and ultra-high-speed LSIs
Author :
Onai, Takahiro ; Ohue, Eiji ; Idei, Yohji ; Tanabe, Masamichi ; Shimamoto, Hiromi ; Washio, Katsuyoshi ; Nakamura, Tohru
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
Volume :
42
Issue :
3
fYear :
1995
fDate :
3/1/1995 12:00:00 AM
Firstpage :
413
Lastpage :
418
Abstract :
Fully symmetrical complementary bipolar transistors for low power-dissipation and ultra-high-speed LSIs have been integrated in the same chip using a 0.3-μm SPOTEC process. Reducing the surface concentration of the boron by oxidation at the surface of the boron diffusion layer suppressed the upward diffusion of boron from the subcollector of the pnp transistor during epitaxial growth. This enabled thin epitaxial layer growth for both npn and pnp transistors simultaneously. Cutoff frequencies of 30 and 32 GHz were obtained in npn and pnp transistors, respectively. Simulated results showed that the power dissipation is reduced to 1/5 in a complementary active pull-down circuit compared with an ECL circuit
Keywords :
bipolar integrated circuits; diffusion; epitaxial growth; integrated circuit technology; large scale integration; oxidation; very high speed integrated circuits; 0.3 micron; 30 GHz; 32 GHz; SPOTEC process; Si:B; active pull-down circuit; boron diffusion layer; cutoff frequencies; epitaxial growth; npn transistor; oxidation; pnp transistor; power dissipation; self-aligned complementary bipolar technology; simulation; surface boron concentration; ultra-high-speed LSIs; Bipolar transistors; Boron; Circuits; Cutoff frequency; Delay; Epitaxial growth; Large scale integration; Oxidation; Power dissipation; Switches;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.368037
Filename :
368037
Link To Document :
بازگشت