DocumentCode :
1247133
Title :
Networking automatic test equipment environments
Author :
Benetazzo, Luigino ; Bertocco, Matteo ; Narduzzi, Claudio
Volume :
8
Issue :
1
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
16
Lastpage :
21
Abstract :
Automatic test equipment (ATE) is a term that, in its broadest meaning, indicates a generic system capable of performing measurements in an automatic or semiautomated (human-assisted) way. Years ago, this term was used specifically to refer to an automated measurement system employed to test the functionality of some electronic device-under-test (DUT). Typical applications were in the manufacturing area, where ATE had a twofold nature: in-circuit testing and functional testing. For in-circuit testing, ATE often were stand-alone complex programmable machines, equipped with a bed-of-nails adapter specifically designed as a fixture to provide signal inputs and meaningful test-points of the DUT. The test engineer had the responsibility of writing code that determined the exact sequence of stimulus signals, response measurements, and go/no-go decisions. For this aim, a switch matrix and the ATE itself were suitably controlled and coordinated by a workstation. For functional testing, ATE consisted of off-the-shelf instruments connected to the DUT by some kind of front-end adapter. In the latter case, most of the effort of the test engineer consisted of designing a program to control the various instruments to assess DUT performances. When planning the use of a dedicated testing machine as opposed to a test bench, other factors were taken into account: measurement speed, cost, and fault coverage.
Keywords :
automatic test equipment; circuit testing; computer networks; test equipment; automated measurement system; cost factor; dedicated testing machine; electronic device-under-test; fault coverage; functional testing; in-circuit testing; measurement speed; networking automatic test equipment; off-the-shelf instruments; response measurements; stand-alone complex programmable machines; switch matrix; Automatic test equipment; Automatic testing; Electronic equipment testing; Fixtures; Instruments; Manufacturing; Performance evaluation; Signal design; Switches; System testing;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2005.1405919
Filename :
1405919
Link To Document :
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