The influence of the arc voltage in synthetic test circuits

Author

van der Sluis, L. ; Sheng, B.L.

Author_Institution

Power Syst. Lab., Delft Univ. of Technol., Netherlands

Volume

10

Issue

1

fYear

1995

fDate

1/1/1995 12:00:00 AM

Firstpage

274

Lastpage

279

Abstract

In this paper different arc voltage waveforms and KEMA arc models are used to study the stress of the direct SLF (short line fault) test circuit and the synthetic SLF test circuit on the TB (test breaker). For the synthetic test circuit the total arc energy input in the TB is less than in the direct test circuit, but just before the current zero the dI/dt and subsequently the arc energy input in the TB is higher. It is demonstrated that the arc-circuit interaction plays an important role for the TB to clear the fault. For SF₆ breakers with an arc voltage with a significant extinguishing peak, the voltage injection synthetic test circuit produces an overstress for the TB

Keywords

SF₆ insulation; arcs (electric); circuit-breaking arcs; gas blast circuit breakers; switchgear testing; KEMA arc models; SF₆; SF₆ breakers; arc voltage; direct test circuit; overstress; short line fault test circuit; synthetic test circuit; synthetic test circuits; total arc energy input; voltage injection synthetic test circuit; Circuit breakers; Circuit faults; Circuit testing; Laboratories; Power system faults; Power system modeling; Short circuit currents; Stress; System testing; Voltage;

fLanguage

English

Journal_Title

Power Delivery, IEEE Transactions on

Publisher

ieee

ISSN

0885-8977

Type

jour

DOI

10.1109/61.368389

Filename

368389