DocumentCode :
1247245
Title :
Nonphotolithographic nanoscale memory density prospects
Author :
DeHon, André ; Goldstein, Seth Copen ; Kuekes, Philip J. ; Lincoln, Patrick
Author_Institution :
Comput. Sci. Dept., California Inst. of Technol., Pasadena, CA, USA
Volume :
4
Issue :
2
fYear :
2005
fDate :
3/1/2005 12:00:00 AM
Firstpage :
215
Lastpage :
228
Abstract :
Technologies are now emerging to construct molecular-scale electronic wires and switches using bottom-up self-assembly. This opens the possibility of constructing nanoscale circuits and memories where active devices are just a few nanometers square and wire pitches may be on the order of ten nanometers. The features can be defined at this scale without using photolithography. The available assembly techniques have relatively high defect rates compared to conventional lithographic integrated circuits and can only produce very regular structures. Nonetheless, with proper memory organization, it is reasonable to expect these technologies to provide memory densities in excess of 1011 b/cm2 with modest active power requirements under 0.6 W/Tb/s for random read operations.
Keywords :
molecular electronics; nanoelectronics; nanolithography; nanowires; self-assembly; storage management; switches; high defect rate; memory densities; memory organization; molecular scale electronic wires; nanoscale circuits; nonphotolithographic nanoscale memory density prospects; photolithography; power requirement; self-assembly; switches; wire pitches; Circuits; Computer science; Hysteresis; Laboratories; Lithography; Nanoscale devices; Nonvolatile memory; Self-assembly; Switches; Wires; Defect tolerance; electronic nanotechnology; memory density; memory organization; molecular electronics;
fLanguage :
English
Journal_Title :
Nanotechnology, IEEE Transactions on
Publisher :
ieee
ISSN :
1536-125X
Type :
jour
DOI :
10.1109/TNANO.2004.837849
Filename :
1405998
Link To Document :
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