Title :
POMR: a power-aware interconnect optimization methodology
Author :
Youssef, Ahmed ; Anis, Mohab ; Elmasry, Mohamed
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Ont., Canada
fDate :
3/1/2005 12:00:00 AM
Abstract :
As VLSI technologies scale down, the average die size is expected to remain constant or to slightly increase with each generation. This results in an average increase in the global interconnect lengths. To mitigate their impact, buffer insertion has become the most widely used technique. However, unconstrained buffering is expected to require several hundreds of thousands of global interconnect buffers. This increased number of buffers is destined to adversely impact the chip power consumption. In this paper, an optimal power maze routing and buffer insertion/sizing problem for a two-pin net is formulated, as a shortest paths ranking problem. The pseudopolynomial time bound of the new formulation fits well within the context of the increased number of buffers. In fact, power savings as high as 25% for the 130-nm technology with a 10% sacrifice in delay is achieved. Furthermore, with the advent of dual threshold technologies, power sensitive applications can substantially benefit from adopting dual threshold buffers. Accordingly, the proposed problem formulation is extended to incorporate the selection of the buffer threshold voltage, where a twofold increase in power savings is observed. During the assessment of the impact of technology scaling using a set of MCNC Benchmarks, an average power saving as high as 35% with a 10% sacrifice in delay is observed. In addition, there is a 10% variation in the power savings when accounting for the process variations.
Keywords :
buffer circuits; circuit optimisation; graph theory; integrated circuit interconnections; integrated circuit layout; network routing; MCNC benchmark circuits; MOS integrated circuits; POMR; VLSI technology; buffer insertion problem; buffer sizing problem; buffer threshold voltage; chip power consumption; dual threshold buffers; global interconnect buffers; integrated circuit testing; optimal power maze routing; power aware interconnect optimization; power saving; pseudopolynomial time bound; shortest path ranking problem; Chip scale packaging; Councils; Delay; Energy consumption; MOSFET circuits; Optimization methods; Routing; Threshold voltage; Very large scale integration; Wire; Buffer insertion; dual-threshold MOSFET; global routing; interconnect optimization; maze routing;
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
DOI :
10.1109/TVLSI.2004.842901