Title :
InP DHBT-Based IC Technology for 100-Gb/s Ethernet
Author :
Driad, Rachid ; Rosenzweig, Josef ; Makon, Robert Elvis ; Lösch, Rainer ; Hurm, Volker ; Walcher, Herbert ; Schlechtweg, Michael
Author_Institution :
Fraunhofer Inst. for Appl. Solid State Phys., Freiburg, Germany
Abstract :
It is now clear that 112-Gb/s data rate is the next step in the network evolution (100-Gb/s Ethernet). Due to its high speed and high breakdown voltage, the InP double-heterojunction bipolar transistor (DHBT) technology is particularly suited for signal processing and high-speed communication systems. This paper summarizes our InP DHBT device and integrated circuit (IC) technology developed for >; 100-Gb/s-class medium scale mixed-signal ICs. Key features and issues important for the growth and manufacturing of InP DHBTs with step-graded collectors are first discussed. The molecular-beam-epitaxy-grown transistors have cut-off frequencies (fT and fmax) of over 350 GHz, current gains of ~90, and common-emitter breakdown voltages of >; 4.5 V. Using this technology, we then fabricated and succeeded in 112-Gb/s testing of multiplexers and integrated clock and data recovery/1:2 demultiplexer ICs and modules with very clear eye waveforms. Using the same technology, a distributed amplifier intended for use as a modulator driver exhibited an output voltage swing of ~2 Vpp. These building-block ICs combine high-speed operation with high signal quality and enable 112-Gb/s optical fiber transmission.
Keywords :
III-V semiconductors; distributed amplifiers; heterojunction bipolar transistors; indium compounds; local area networks; mixed analogue-digital integrated circuits; molecular beam epitaxial growth; multiplexing equipment; optical fibre communication; signal processing; DHBT based IC technology; Ethernet; InP; bit rate 100 Gbit/s; building block IC; common emitter breakdown voltage; data recovery; demultiplexer IC; distributed amplifier; double heterojunction bipolar transistor technology; high signal quality; high speed communication system; integrated circuit technology; medium scale mixed signal IC; modulator driver; molecular beam epitaxy grown transistor; network evolution; optical fiber transmission; signal processing; step graded collector; Clocks; DH-HEMTs; Fabrication; Gain; Indium gallium arsenide; Indium phosphide; Integrated circuits; Double-heterojunction bipolar transistors (DHBTs); InP; integrated circuit (IC) technology; mixed analog/digital ICs;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2011.2157927