Title :
A CMOS Time-to-Digital Converter (TDC) Based On a Cyclic Time Domain Successive Approximation Interpolation Method
Author :
Mäntyniemi, Antti ; Rahkonen, Timo ; Kostamovaara, Juha
Author_Institution :
Electron. Lab., Univ. of Oulu, Oulu, Finland
Abstract :
This paper describes a time-to-digital converter (TDC) with ~1.2 ps resolution and ~327 mus dynamic range suitable for laser range-finding application for example. The resolution of ~1.2 ps is achieved with interpolation based on a cyclic time domain successive approximation (CTDSA) method that resolves the time difference between two non-repetitive signals using binary search. The method utilizes a pair of digital-to-time converters (DTC), the propagation delay difference between which is implemented by digitally controlling the unit load capacitors of their delay cells, thus enabling sub-gate delay timing resolution. The rms single-shot precision, i.e., standard deviation sigma-value of the TDC is 3.2 ps, which is achieved by using an external integral nonlinearity look-up table (INL-LUT) for the interpolators. The power consumption is 33 mW at 100 MHz with a 3.3 V operating voltage. The prototypes were fabricated in a 0.35 mum CMOS process.
Keywords :
CMOS digital integrated circuits; convertors; interpolation; table lookup; CMOS time-to-digital converter; cyclic time domain successive approximation interpolation method; external integral nonlinearity look-up table; frequency 100 MHz; power 33 mW; rms single-shot precision; size 0.35 mum; standard deviation; sub-gate delay timing resolution; time 1.2 ps; time 3.2 ps; time 327 mus; voltage 3.3 V; Capacitors; Digital control; Dynamic range; Energy consumption; Interpolation; Laser applications; Propagation delay; Signal resolution; Table lookup; Timing; All-digital delay-locked loop (ADDLL); CMOS integrated circuits; delay line interpolation; delay-locked loop (DLL); digital-to-time converter (DTC); successive approximation register (SAR); time digitizer; time interval measurement; time-to-digital converter (TDC);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2009.2032260