DocumentCode :
1248410
Title :
Experimental and Theoretical Study of InAs/InGaAsP/InP Quantum Dash Lasers
Author :
Heck, Susannah Claire ; Osborne, Simon ; Healy, Sorcha B. ; Reilly, Eoin P O ; Lelarge, François ; Poingt, Francis ; Le Gouezigou, Odile ; Accard, Alain
Author_Institution :
Tyndall Nat. Inst., Cork, Ireland
Volume :
45
Issue :
12
fYear :
2009
Firstpage :
1508
Lastpage :
1516
Abstract :
We present a combined theoretical and experimental analysis of InAs/InGaAsP/InP quantum dash lasers. Calculations using an 8 band k.p Hamiltonian show that electron states, due to the low effective mass and small conduction band offsets, are not confined in the dash in the case of dash-in-a-well structures and are only weakly confined in dash-in-a-barrier structures. The shape of the dashes leads to an experimentally observed enhancement of spontaneous emission (SE) and therefore of gain for light polarized along the dash long axis, with the measured SE enhancement in excellent agreement with the theoretical calculations. An analysis of the variation of the integrated spontaneous emission rate with total current and with temperature reveals that, despite the reduced dimensionality of the active region, the threshold current of these lasers, and its temperature dependence, remain dominated by Auger recombination.
Keywords :
Auger effect; III-V semiconductors; electron-hole recombination; gallium arsenide; gallium compounds; indium compounds; laser beams; quantum dash lasers; spontaneous emission; Auger recombination; InAs-InGaAsP-InP; dash-in-a-barrier structures; dash-in-a-well structures; electron states; light polarization; quantum dash laser; semiconductor laser; spontaneous emission; temperature dependence; Effective mass; Electrons; Gain measurement; Indium phosphide; Laser theory; Optical polarization; Quantum dots; Shape measurement; Spontaneous emission; Temperature dependence; InP; quantum dashes; quantum dot (QD); semiconductor lasers; telecommunication lasers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2009.2020814
Filename :
5308687
Link To Document :
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