DocumentCode
1248410
Title
Experimental and Theoretical Study of InAs/InGaAsP/InP Quantum Dash Lasers
Author
Heck, Susannah Claire ; Osborne, Simon ; Healy, Sorcha B. ; Reilly, Eoin P O ; Lelarge, François ; Poingt, Francis ; Le Gouezigou, Odile ; Accard, Alain
Author_Institution
Tyndall Nat. Inst., Cork, Ireland
Volume
45
Issue
12
fYear
2009
Firstpage
1508
Lastpage
1516
Abstract
We present a combined theoretical and experimental analysis of InAs/InGaAsP/InP quantum dash lasers. Calculations using an 8 band k.p Hamiltonian show that electron states, due to the low effective mass and small conduction band offsets, are not confined in the dash in the case of dash-in-a-well structures and are only weakly confined in dash-in-a-barrier structures. The shape of the dashes leads to an experimentally observed enhancement of spontaneous emission (SE) and therefore of gain for light polarized along the dash long axis, with the measured SE enhancement in excellent agreement with the theoretical calculations. An analysis of the variation of the integrated spontaneous emission rate with total current and with temperature reveals that, despite the reduced dimensionality of the active region, the threshold current of these lasers, and its temperature dependence, remain dominated by Auger recombination.
Keywords
Auger effect; III-V semiconductors; electron-hole recombination; gallium arsenide; gallium compounds; indium compounds; laser beams; quantum dash lasers; spontaneous emission; Auger recombination; InAs-InGaAsP-InP; dash-in-a-barrier structures; dash-in-a-well structures; electron states; light polarization; quantum dash laser; semiconductor laser; spontaneous emission; temperature dependence; Effective mass; Electrons; Gain measurement; Indium phosphide; Laser theory; Optical polarization; Quantum dots; Shape measurement; Spontaneous emission; Temperature dependence; InP; quantum dashes; quantum dot (QD); semiconductor lasers; telecommunication lasers;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2009.2020814
Filename
5308687
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