DocumentCode
1248414
Title
Double Mesa Sidewall Silicon Carbide Avalanche Photodiode
Author
Liu, Han-Din ; Zheng, Xiaoguang ; Zhou, Qiugui ; Bai, Xiaogang ; Mcintosh, Dion C. ; Campbell, Joe C.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Virginia, Charlottesville, VA, USA
Volume
45
Issue
12
fYear
2009
Firstpage
1524
Lastpage
1528
Abstract
We report a double mesa 4H-SiC avalanche photodiode (APD) that suppresses premature edge break-down. The motivation for the double mesa structure is to eliminate the optically dead region that extends radially up to 30 mum beyond the active region of conventional beveled mesa SiC APDs, which can significantly restrict the fill-factor of arrays.
Keywords
avalanche photodiodes; semiconductor device breakdown; silicon compounds; wide band gap semiconductors; SiC; active region; avalanche photodiode; double mesa sidewall silicon carbide APD; fill factor; optically dead region; premature edge breakdown; Aluminum gallium nitride; Avalanche photodiodes; Biomedical optical imaging; Dark current; Detectors; Electric breakdown; Optical arrays; Optical sensors; Photodetectors; Silicon carbide; Avalanche photodiodes; photodetector; silicon carbide; ultraviolet detector;
fLanguage
English
Journal_Title
Quantum Electronics, IEEE Journal of
Publisher
ieee
ISSN
0018-9197
Type
jour
DOI
10.1109/JQE.2009.2022046
Filename
5308688
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