DocumentCode :
1248512
Title :
EMI filter design: Part II: Measurement of noise source impedances
Author :
Tarateeraseth, V.
Author_Institution :
Dept. of Electr. Eng., Srinakharinwirot Univ., Bangkok, Thailand
Volume :
1
Issue :
1
fYear :
2012
Firstpage :
42
Lastpage :
49
Abstract :
In the first part of the EMI filter design series, the conducted EMI generation mechanism was explained. In this second part, a method on the measurement of noise source impedance of SMPS will be described. The proposed measurement method allows accurate extraction of the common-mode and differential mode equivalent noise source impedances of a SMPS under it actual operating conditions.
Keywords :
electric impedance measurement; electromagnetic devices; electromagnetic interference; filters; noise measurement; EMI filter design; SMPS; common-mode extraction; differential mode equivalent noise source impedances; noise source impedance measurement; Delta modulation; Filters; Impedance; Impedance measurement; Noise measurement; Switched-mode power supply;
fLanguage :
English
Journal_Title :
Electromagnetic Compatibility Magazine, IEEE
Publisher :
ieee
ISSN :
2162-2264
Type :
jour
DOI :
10.1109/MEMC.2012.6244944
Filename :
6244944
Link To Document :
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