DocumentCode :
1248529
Title :
Local threshold and Boolean function based edge detection
Author :
Ahmad, Muhammad Bilal ; Choi, Tae-Sun
Author_Institution :
Dept. of Mechatronics, Kwangju Inst. of Sci. & Technol., South Korea
Volume :
45
Issue :
3
fYear :
1999
fDate :
8/1/1999 12:00:00 AM
Firstpage :
674
Lastpage :
679
Abstract :
Localization of edge points in images is one of the most important starting steps in image processing. Many varied edge detection techniques have been proposed. Different edge detectors present distinct and different responses to the same image, showing different details. We present a new approach for edge detection. The actual gray level image is locally thresholded using the local mean value to make a binary image. The binary image is checked for edges by comparison with the known edge like patterns, utilizing Boolean algebra. This approach recognizes nearly all-actual edges and edges due to noise. For removing edges due to noise, we adopt another approach. This time the actual image is globally thresholded by the variance value of the image. The two resulting images are logically ANDed to get the final edge map
Keywords :
Boolean algebra; edge detection; noise; Boolean algebra; Boolean function based edge detection; binary image; edge like patterns; edge map; edge points localization; globally thresholded image; gray level image; image processing; local mean value; local threshold based edge detection; noise; Boolean algebra; Boolean functions; Brightness; Detectors; Image edge detection; Image processing; Laplace equations; Mechatronics; Pixel; Senior members;
fLanguage :
English
Journal_Title :
Consumer Electronics, IEEE Transactions on
Publisher :
ieee
ISSN :
0098-3063
Type :
jour
DOI :
10.1109/30.793567
Filename :
793567
Link To Document :
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