DocumentCode :
1248829
Title :
Effects of Nanoscale Contacts to Graphene
Author :
Franklin, Aaron D. ; Han, Shu-Jen ; Bol, Ageeth A. ; Haensch, Wilfried
Author_Institution :
T.J. Watson Res. Center, IBM, Yorktown Heights, NY, USA
Volume :
32
Issue :
8
fYear :
2011
Firstpage :
1035
Lastpage :
1037
Abstract :
Understanding and optimizing transport between metal contacts and graphene is one of the foremost challenges for graphene devices. In this letter, we present the first results on the effects of reducing contact dimensions to the nanoscale in single-layer graphene transistors. Using noninvasive voltage probes to the graphene channel, the contact resistance was extracted and observed to increase dramatically at contact lengths below 200 nm. Also affected was the extrinsic transconductance, reducing by more than 70% when scaling the contacts from 200 to 50 nm. No significant change in performance per unit width was observed when reducing the contact/device width from 500 to 80 nm. These results provide key insights into the ultimate scalability of graphene transistors, particularly when considering them for a densely integrated technology.
Keywords :
contact resistance; field effect transistors; graphene; C; contact resistance; extrinsic transconductance; field-effect transistor; graphene channel; nanoscale contact effects; noninvasive voltage probes; single-layer graphene transistors; size 200 nm to 50 nm; size 500 nm to 80 nm; Contact resistance; Metals; Nanoscale devices; Probes; Resistance; Substrates; Transistors; Contact resistance; field-effect transistor; graphene; length scaling;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2158058
Filename :
5898385
Link To Document :
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