• DocumentCode
    1248918
  • Title

    Analysis of Dynamic Range, Linearity, and Noise of a Pulse-Frequency Modulation Pixel

  • Author

    Tsai, Tsung-Hsun ; Hornsey, Richard

  • Author_Institution
    Dept. of Comput. Sci. & Eng., York Univ., Toronto, ON, Canada
  • Volume
    59
  • Issue
    10
  • fYear
    2012
  • Firstpage
    2675
  • Lastpage
    2681
  • Abstract
    A complete pulse-frequency modulation (PFM) pixel design analysis and noise measurement for CMOS image sensor applications are presented. This work investigates the design parameters such as dynamic range (DR), signal linearity, and comparator characteristics. The design strategies for wide DR imaging are addressed in detail, and signal linearity is analyzed by considering the analog circuit parameters. The temporal noise is also measured to understand the design tradeoffs of the PFM pixels. The analysis is executed by performing HSPICE simulation and practical pixel measurements. The technology used by the measured pixel is a 0.18-μm one-poly six-metal CMOS process. According to the results, a PFM pixel using the submicrometer CMOS process has a DR of 130-160 dB, and the cost of reaching a higher signal linearity or lower noise floor is the loss of frame rate. In addition, the bandwidth of the comparator can be extended to improve sensor linearity.
  • Keywords
    CMOS image sensors; comparators (circuits); noise measurement; pulse frequency modulation; CMOS image sensor application; DR parameter; HSPICE simulation; PFM pixel design analysis; analog circuit parameter; comparator bandwidth; comparator characteristics; dynamic range parameter; frame rate loss; gain 130 dB to 160 dB; noise floor; one-poly six-metal CMOS process; practical pixel measurement; pulse-frequency modulation pixel design analysis; sensor linearity; signal linearity; size 0.18 mum; submicrometer CMOS process; temporal noise measurement; Dynamic range; Imaging; Lighting; Linearity; Noise; Photodiodes; Transistors; CMOS image sensor; dynamic range (DR); pixel; pulse-frequency modulation (PFM); signal linearity; temporal noise;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2205690
  • Filename
    6246684