DocumentCode
1249046
Title
DVLASIC: catastrophic fault yield simulation in a distributed processing environment
Author
Walker, D.M.H. ; Nydick, Daniel S.
Author_Institution
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume
9
Issue
6
fYear
1990
fDate
6/1/1990 12:00:00 AM
Firstpage
655
Lastpage
664
Abstract
Simulation of local process disturbances is a computationally intensive task. The VLASIC (VLSI LAyout Simulation for Integrated Circuits) catastrophic-fault yield simulator uses a Monte Carlo method that often requires tens of CPU hours to perform a simulation. In order to reduce the simulation time, DVLASIC, the distributed-environment version developed by the authors, achieves a speedup of 13.3 over VLASIC, with an efficiency of 89%. The authors describe the distributed processing environment and implementation techniques used to obtain this speedup. The distributed processing environment can also be applied to many other CAD problems
Keywords
Monte Carlo methods; VLSI; circuit layout CAD; fault location; DVLASIC; Monte Carlo method; VLSI LAyout Simulation for Integrated Circuits; catastrophic fault yield simulation; distributed processing environment; Central Processing Unit; Circuit faults; Circuit simulation; Computational modeling; Design optimization; Distributed processing; Integrated circuit yield; Parallel processing; Very large scale integration; Workstations;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.55195
Filename
55195
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