• DocumentCode
    1249046
  • Title

    DVLASIC: catastrophic fault yield simulation in a distributed processing environment

  • Author

    Walker, D.M.H. ; Nydick, Daniel S.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    9
  • Issue
    6
  • fYear
    1990
  • fDate
    6/1/1990 12:00:00 AM
  • Firstpage
    655
  • Lastpage
    664
  • Abstract
    Simulation of local process disturbances is a computationally intensive task. The VLASIC (VLSI LAyout Simulation for Integrated Circuits) catastrophic-fault yield simulator uses a Monte Carlo method that often requires tens of CPU hours to perform a simulation. In order to reduce the simulation time, DVLASIC, the distributed-environment version developed by the authors, achieves a speedup of 13.3 over VLASIC, with an efficiency of 89%. The authors describe the distributed processing environment and implementation techniques used to obtain this speedup. The distributed processing environment can also be applied to many other CAD problems
  • Keywords
    Monte Carlo methods; VLSI; circuit layout CAD; fault location; DVLASIC; Monte Carlo method; VLSI LAyout Simulation for Integrated Circuits; catastrophic fault yield simulation; distributed processing environment; Central Processing Unit; Circuit faults; Circuit simulation; Computational modeling; Design optimization; Distributed processing; Integrated circuit yield; Parallel processing; Very large scale integration; Workstations;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.55195
  • Filename
    55195