Title :
Hysteresis Modeling in an Electro-Magnetic Transients Program
Author :
Frame, James G. ; Mohan, Narendra ; Liu, Tsu-huei
Author_Institution :
Control Data Corporation, Energy Management Systems Division, Plymouth, MN
Keywords :
Circuit faults; EMTP; Electromagnetic modeling; Hysteresis; Impedance; Inductors; Power system modeling; Power system transients; Testing; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1982.5519502