DocumentCode :
1249281
Title :
Tilted Wave Lasers: A Way to High Brightness Sources of Light
Author :
Shchukin, Vitaly ; Ledentsov, Nikolay ; Posilovic, Kristijan ; Kalosha, Vladimir ; Kettler, Thorsten ; Seidlitz, Daniel ; Winterfeldt, Martin ; Bimberg, Dieter ; Gordeev, Nikita Yu ; Karachinsky, Leonid Ya ; Novikov, Innokenty I. ; Shernyakov, Yuri M. ; C
Author_Institution :
Inst. for Solid State Phys., Tech. Univ. of Berlin, Berlin, Germany
Volume :
47
Issue :
7
fYear :
2011
fDate :
7/1/2011 12:00:00 AM
Firstpage :
1014
Lastpage :
1027
Abstract :
Semiconductor laser diodes are conventionally based on a relatively thin waveguide structure grown epitaxially on a thick single crystalline substrate, wherein the latter serves as a medium for carrier flow and as mechanical support and plays no role in optics. Although earlier attempts to provide the outcoupling of light through a transparent substrate in leaky lasers realized a narrow leaky emission beam, either significant leakage losses led to the deterioration of the laser performance or/and a large fraction of the output optical power was concentrated in a co-existing angularly broad emission peak originating from the narrow active waveguide. Our solution, a tilted wave laser (TWL), includes polishing the back side of the substrate under the stripe providing mirror-like reflection for the leaky mode which can thus exhibit multiple reflection and amplification cycles before exiting the device from the substrate facet. Fulfillment of phase matching conditions allows wavelength-stabilized operation. At a wavelength of 1060 nm TWLs are shown to exhibit a very small thermal shift of the emission wavelength of 0.03 nm/K. A cw output power of 3.3 W for 2 mm long cavities with uncoated facets is obtained, wherein the entire power is concentrated in a single vertical lobe having a full width at half maximum of 0.8°. The scattering of the tilted optical wave by the back substrate surface roughness is modeled and found to be the main mechanism limiting the differential efficiency, wherein the scattering contributes up to 10 cm-1 to the losses for a present roughness of ~30 nm. The free carrier absorption in the n-doped substrate ( ~3 cm-1 for n ~1018 cm-3) dominates for a roughness <; 10 nm.
Keywords :
epitaxial growth; light scattering; light sources; optical phase matching; optical waveguides; semiconductor lasers; surface roughness; active waveguide; carrier flow; differential efficiency; epitaxial growth; leakage losses; leaky lasers; leaky mode; light sources; mechanical support; narrow leaky emission beam; phase matching conditions; power 3.3 W; relatively thin waveguide structure; semiconductor laser diodes; substrate facet; the back substrate surface roughness; tilted optical wave scattering; tilted wave lasers; vertical lobe; wavelength 1060 nm; Laser beams; Laser modes; Optical surface waves; Optical waveguides; Substrates; Surface emitting lasers; Waveguide lasers; High-power lasers; optical waveguides; semiconductor lasers; terms-high-brightness lasers;
fLanguage :
English
Journal_Title :
Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9197
Type :
jour
DOI :
10.1109/JQE.2011.2132116
Filename :
5898998
Link To Document :
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