Title :
Time-censored ramp tests with stress bound for Weibull life distribution
Author :
Bai, D.S. ; Chun, Y.R. ; Cha, M.S.
Author_Institution :
Dept. of Ind. Eng., Korea Adv. Inst. of Sci. & Technol., Taejon, South Korea
fDate :
3/1/1997 12:00:00 AM
Abstract :
This paper considers ramp tests for Weibull life distribution when there are limitations on test stress and test time. The inverse power law and a cumulative exposure model are assumed. Maximum likelihood estimators of model parameters and their asymptotic covariance matrix are shown. The optimum ramp test plans are given which minimize the asymptotic variance of the ML estimator of a specified quantile of log(life) at design constant stress. The effects of the pre-estimates of design parameters are studied
Keywords :
Weibull distribution; covariance matrices; life testing; maximum likelihood estimation; reliability theory; Maximum likelihood estimators; Weibull life distribution; accelerated life tests; asymptotic covariance matrix; cumulative exposure model; design parameters; inverse power law; model parameters; reliability modelling; stress bound; test stress; test time; time-censored ramp tests; Covariance matrix; Fatigue; Insulation testing; Life estimation; Life testing; Maximum likelihood estimation; Parameter estimation; Stress; Upper bound; Weibull distribution;
Journal_Title :
Reliability, IEEE Transactions on
