DocumentCode :
1249658
Title :
A charge conserving non-quasi-state (NQS) MOSFET model for SPICE transient analysis
Author :
Park, Hong-June ; Ko, Ping Keung ; Hu, Chenming
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Volume :
10
Issue :
5
fYear :
1991
fDate :
5/1/1991 12:00:00 AM
Firstpage :
629
Lastpage :
642
Abstract :
An analytic charge-conserving non-quasi-static (NQS) model is derived for long-channel MOSFETs and has been implemented in SPICE3. The model is based on approximate solutions to the transient current continuity equation, an analytic equations are derived for node charges using the charge-sheet formulation. The NQS effects in several test circuits, which include a pass transistor, a CMOS inverter chain, and a differential sample-hold circuit, are stimulated. Excellent agreements have been observed among this work, PISCES (2-D device simulation), the 1-D numerical simulation, the multiple lump model, and CODECS (a mixed device and circuit simulation). However, large differences have been observed between this work and conventional quasi-static (QS) models. The model computation time of this work implemented in SPICE3 is about 2-3 times larger than those of QS models (BSIM, Level-2 Meyer) in SPICE3
Keywords :
circuit analysis computing; insulated gate field effect transistors; semiconductor device models; transient response; MOSFET model; NQS effects; SPICE transient analysis; SPICE3; approximate solutions; charge conserving; charge-sheet formulation; long-channel MOSFETs; model computation time; node charges; nonquasistatic model; transient current continuity equation; Circuit simulation; Circuit testing; Computational modeling; Equations; Inverters; MOSFET circuits; Numerical simulation; SPICE; Semiconductor device modeling; Transient analysis;
fLanguage :
English
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
0278-0070
Type :
jour
DOI :
10.1109/43.79500
Filename :
79500
Link To Document :
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