• DocumentCode
    1249854
  • Title

    OBDD-based network reliability calculation

  • Author

    Yeh, Fu-Min ; Kuo, Sy-Yen

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • Volume
    33
  • Issue
    9
  • fYear
    1997
  • fDate
    4/24/1997 12:00:00 AM
  • Firstpage
    759
  • Lastpage
    760
  • Abstract
    An efficient method for evaluating the terminal-pair reliability based on an edge expansion tree and using an OBDD (ordered binary decision diagram) is presented. The effectiveness of the algorithm is demonstrated on the larger benchmarks collected in previous work. One notable case of the experimental results for a 2×20 lattice network is that the number of nodes in the OBDD is linearly proportional to the number of stages. This is significantly superior to previous algorithms which are based on the sum of disjoint products and has exponential complexity
  • Keywords
    reliability theory; OBDD-based reliability calculation; edge expansion tree; network reliability calculation; ordered BDD; ordered binary decision diagram; terminal-pair reliability;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19970549
  • Filename
    590216
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1249854