DocumentCode :
1249950
Title :
Transient Thermal Resistance Test of Single-Crystal-Silicon Solar Cell
Author :
Zhang, Jihong ; Gao, Yulin ; Lu, Yijun ; Zhu, Lihong ; Guo, Ziquan ; Chen, Guolong ; Chen, Zhong
Author_Institution :
Department of Electronic Science, Fujian Engineering Research Center for Solid-State Lighting, Xiamen University, Xiamen, China
Volume :
59
Issue :
9
fYear :
2012
Firstpage :
2345
Lastpage :
2349
Abstract :
This paper reports the measurement of the junction temperature and the determination of the thermal resistance of the single-crystal-silicon solar cell under the dark and illuminating conditions, respectively. Under the dark condition, the solar cell is considered as a conventional p-n junction and is subject to a reverse current in order to measure its junction temperature and determine the thermal resistance. A white LED array is used as the light source to operate the solar cell in order to avoid the heating effect of the infrared light by the solar simulator. Furthermore, we thoroughly calculate the thermal dissipation power. The result demonstrates that the thermal resistance drops from 3.7 to 2.0 K/W with the increase of the irradiance from 89.6 to 194.3 \\hbox {W/m}^{2} . It is also found that the thermal resistance under the dark condition is much higher than that under the illuminating condition, which is attributed to the light effect on the thermal resistance.
Keywords :
Light emitting diodes; Photovoltaic cells; Temperature measurement; Temperature sensors; Thermal resistance; Solar cell; thermal dissipation power; thermal resistance; white LED array;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/TED.2012.2204997
Filename :
6248199
Link To Document :
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