DocumentCode
1249950
Title
Transient Thermal Resistance Test of Single-Crystal-Silicon Solar Cell
Author
Zhang, Jihong ; Gao, Yulin ; Lu, Yijun ; Zhu, Lihong ; Guo, Ziquan ; Chen, Guolong ; Chen, Zhong
Author_Institution
Department of Electronic Science, Fujian Engineering Research Center for Solid-State Lighting, Xiamen University, Xiamen, China
Volume
59
Issue
9
fYear
2012
Firstpage
2345
Lastpage
2349
Abstract
This paper reports the measurement of the junction temperature and the determination of the thermal resistance of the single-crystal-silicon solar cell under the dark and illuminating conditions, respectively. Under the dark condition, the solar cell is considered as a conventional p-n junction and is subject to a reverse current in order to measure its junction temperature and determine the thermal resistance. A white LED array is used as the light source to operate the solar cell in order to avoid the heating effect of the infrared light by the solar simulator. Furthermore, we thoroughly calculate the thermal dissipation power. The result demonstrates that the thermal resistance drops from 3.7 to 2.0 K/W with the increase of the irradiance from 89.6 to 194.3
. It is also found that the thermal resistance under the dark condition is much higher than that under the illuminating condition, which is attributed to the light effect on the thermal resistance.
Keywords
Light emitting diodes; Photovoltaic cells; Temperature measurement; Temperature sensors; Thermal resistance; Solar cell; thermal dissipation power; thermal resistance; white LED array;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/TED.2012.2204997
Filename
6248199
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