• DocumentCode
    1249950
  • Title

    Transient Thermal Resistance Test of Single-Crystal-Silicon Solar Cell

  • Author

    Zhang, Jihong ; Gao, Yulin ; Lu, Yijun ; Zhu, Lihong ; Guo, Ziquan ; Chen, Guolong ; Chen, Zhong

  • Author_Institution
    Department of Electronic Science, Fujian Engineering Research Center for Solid-State Lighting, Xiamen University, Xiamen, China
  • Volume
    59
  • Issue
    9
  • fYear
    2012
  • Firstpage
    2345
  • Lastpage
    2349
  • Abstract
    This paper reports the measurement of the junction temperature and the determination of the thermal resistance of the single-crystal-silicon solar cell under the dark and illuminating conditions, respectively. Under the dark condition, the solar cell is considered as a conventional p-n junction and is subject to a reverse current in order to measure its junction temperature and determine the thermal resistance. A white LED array is used as the light source to operate the solar cell in order to avoid the heating effect of the infrared light by the solar simulator. Furthermore, we thoroughly calculate the thermal dissipation power. The result demonstrates that the thermal resistance drops from 3.7 to 2.0 K/W with the increase of the irradiance from 89.6 to 194.3 \\hbox {W/m}^{2} . It is also found that the thermal resistance under the dark condition is much higher than that under the illuminating condition, which is attributed to the light effect on the thermal resistance.
  • Keywords
    Light emitting diodes; Photovoltaic cells; Temperature measurement; Temperature sensors; Thermal resistance; Solar cell; thermal dissipation power; thermal resistance; white LED array;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2012.2204997
  • Filename
    6248199