DocumentCode :
125003
Title :
Simulation-aided UT weld inspection for improving integrity during pipe manufacture
Author :
Rebello, Joao Marcos A. ; Burrowes, Mariana ; Ribeiro Pereira, Gabriela ; Tavares, Luis Marcelo ; Ponciano, Marcos ; Manao, Robson
Author_Institution :
Dept. of Metall. & Mater. Eng., Fed. Univ. of Rio de Janeiro, Rio de Janeiro, Brazil
fYear :
2014
fDate :
20-23 June 2014
Firstpage :
5
Lastpage :
8
Abstract :
Computational simulations and reliability analysis were used to optimize an automated ultrasonic system used in pipe inspections in a manufacture plant in operation. Through the application of these tools the quality of the final product could be improved from more efficiency inspections. The main purpose was to establish the influence of each variable involved in the capacity of the ultrasonic system in detecting flaws. Tests were conducted considering a calibration API X65 steel pipe in which fitted reflectors were inserted artificially according to the DNV-OS-F101 standard. Experimental variables such as index, probe angle and gate position showed an important effect on the efficiency of the system and statistical analyses proved to be a powerful tool to validate the simulated and experimental results.
Keywords :
calibration; flaw detection; inspection; pipes; standards; statistical analysis; steel; steel industry; welds; API X65 steel pipe; DNV-OS-F101 standard; automated ultrasonic system; calibration; computational simulations; fitted reflectors; flaws detection; manufacture plant; pipe inspections; pipe manufacture integrity; reliability analysis; simulation-aided UT weld inspection; statistical analyses; Indexes; Inspection; Logic gates; Probes; Reliability; Standards; Welding; UT inspections; pipeline; reliability; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nondestructive Evaluation/Testing (FENDT), 2014 IEEE Far East Forum on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4799-4731-7
Type :
conf
DOI :
10.1109/FENDT.2014.6928223
Filename :
6928223
Link To Document :
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