Title :
Approximating mutual information for multi-label feature selection
Author :
Lee, Jeyull ; Lim, H. ; Kim, Dong-Won
Author_Institution :
Sch. of Comput. Sci. & Eng., Chung-Ang Univ., Seoul, South Korea
Abstract :
Proposed is a new multi-label feature selection method that captures relationships between features and labels without transforming the problem into single-label classification. Using approximated joint mutual information, the proposed incremental feature selection algorithm provides markedly better classification performance than well-known conventional methods.
Keywords :
feature extraction; image classification; approximated joint mutual information; classification performance; labels; multilabel feature selection; well-known conventional methods;
Journal_Title :
Electronics Letters
DOI :
10.1049/el.2012.1600