DocumentCode
125065
Title
The defects recognition of wheel tread based on linear CCD
Author
Wen Zhang ; Yu Zhang ; Jinlong Li ; Xiaorong Gao ; Li Wang
Author_Institution
Sch. of Phys. Sci. & Technol., Southwest Jiaotong Univ., Chengdu, China
fYear
2014
fDate
20-23 June 2014
Firstpage
302
Lastpage
307
Abstract
In this paper, a defect detecting system of wheel tread based on linear charge coupled device (CCD) is established, and the image recognition technology of wheel tread defects under this system is studied. Firstly, images of the whole wheel tread are captured through the system. Secondly, median filtering and image contrast enhancement are processed on the defect images, and then the canny edge detection based on gradient histogram is performed. Thirdly, the images after edge detection are used for eight-neighbor boundary tracking, in order to obtain the sizes in-pixel of defects. Finally, the linear CCD camera is calibrated by Zhang checkerboard-like calibration method, and the actual sizes of defects are calculated. The results of this experiment show that the detecting system can identify the wheel tread defects effectively, and obtain the defects´ actual width and height accurately through image processing algorithm.
Keywords
CCD image sensors; automatic optical inspection; calibration; edge detection; image enhancement; mechanical engineering computing; median filters; wheels; Zhang checkerboard-like calibration method; canny edge detection; defect detecting system; defect height; defect image; defect recognition; defect width; eight-neighbor boundary tracking; gradient histogram; image contrast enhancement; image processing algorithm; image recognition technology; linear CCD camera; linear charge coupled device; median filtering; wheel tread defects; Calibration; Cameras; Charge coupled devices; Filtering; Image edge detection; Inspection; Wheels; Zhang calibration method; canny edge detection; eight-neighbor method; linear CCD;
fLanguage
English
Publisher
ieee
Conference_Titel
Nondestructive Evaluation/Testing (FENDT), 2014 IEEE Far East Forum on
Conference_Location
Chengdu
Print_ISBN
978-1-4799-4731-7
Type
conf
DOI
10.1109/FENDT.2014.6928285
Filename
6928285
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