Title :
Generalized Method of Analysis of Simultaneous Faults in Electric Power System
Author_Institution :
Rensselaer Polytechnic Institute, Troy, NY
Keywords :
Admittance; Application specific processors; Boundary conditions; Circuit faults; Impedance; Integrated circuit interconnections; Mutual coupling; Passive networks; Voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1982.5519911
