• DocumentCode
    1250735
  • Title

    Breakdown mechanism of liquid nitrogen viewed from area and volume effects

  • Author

    Hayakawa, N. ; Sakakibara, H. ; Goshima, H. ; Hikita, M. ; Okubo, H.

  • Author_Institution
    Nagoya Univ., Japan
  • Volume
    4
  • Issue
    1
  • fYear
    1997
  • fDate
    2/1/1997 12:00:00 AM
  • Firstpage
    127
  • Lastpage
    134
  • Abstract
    We investigated the area and volume effects on the breakdown strength in liquid nitrogen (LN2) to discuss the breakdown mechanism in cryogenic liquids for superconducting power apparatus. We measured breakdown voltages in LN2 with and without thermal bubbles over a very wide range of the electrode size. Experimental results revealed that the breakdown mechanism changed from an area dominant to volume effective region at larger electrode configurations in LN2. Moreover, we discussed the contribution rate of area and volume effects to the breakdown strength in LN2. It was suggested that a mutual contribution of area and volume effects appeared in breakdown characteristics in LN2 under thermal bubble conditions, as a phenomenon peculiar to cryogenic liquids. Consequently, we pointed out that it is very important to consider both thermal bubbles and electrode surface condition for HV insulation of superconducting power apparatus
  • Keywords
    dielectric liquids; electric breakdown; electric strength; insulation testing; machine insulation; machine testing; nitrogen; superconducting machines; HV insulation; N2; area effects; breakdown mechanism; breakdown strength; breakdown voltages; cryogenic liquids; electrode configurations; electrode size; electrode surface condition; liquid N2; superconducting power apparatus insulation; thermal bubbles; volume effects; Cryogenics; Electric breakdown; Electrodes; Liquids; Nitrogen; Ocean temperature; Rough surfaces; Sea surface; Superconducting transmission lines; Surface roughness;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/94.590883
  • Filename
    590883