Title :
A counting CdTe pixel detector for hard X-ray and γ-ray imaging
Author :
Fischer, P. ; Kouda, M. ; Krüger, H. ; Lindner, M. ; Sato, G. ; Takahashi, T. ; Watanabe, S. ; Wermes, N.
Author_Institution :
Phys. Inst., Bonn Univ., Germany
fDate :
12/1/2001 12:00:00 AM
Abstract :
A 0.5-mm-thick cadmium telluride (CdTe) semiconductor pixel sensor with 1024 pixels has been bump-bonded onto a two-dimensional (2-D) single photon counting pixel read out chip (MPEC 2.1) using a special gold-stud technique. The pixel size is 200 × 200 μm2, the active area is 6.4 × 6.4 mm2. The successful operation of this high-Z imaging pixel device is demonstrated. Noise and threshold dispersion as well as the imaging performance are reported
Keywords :
X-ray detection; gamma-ray detection; photon counting; semiconductor counters; semiconductor device noise; γ-ray imaging; 200 micron to 200 micron; CdTe; CdTe pixel detector; MPEC 2.1; gold-stud technique; hard X-ray imaging; imaging; noise; pixel size; single photon counting pixel read out chip; threshold dispersion; Biomedical imaging; Gamma ray detection; Gamma ray detectors; Gold; Optical imaging; Optoelectronic and photonic sensors; Pixel; X-ray detection; X-ray detectors; X-ray imaging;
Journal_Title :
Nuclear Science, IEEE Transactions on
