• DocumentCode
    1250932
  • Title

    Plating of small blind vias [multilayer PCBs]

  • Author

    Kou, Show-Chin ; Hung, Aina

  • Author_Institution
    Dept. of Chem. Eng., Ta-Hwa Inst. of Technol., Hsinchu, Taiwan
  • Volume
    22
  • Issue
    3
  • fYear
    1999
  • fDate
    7/1/1999 12:00:00 AM
  • Firstpage
    202
  • Lastpage
    208
  • Abstract
    Metallization of laminates with blind vias on the dielectric side was performed by electroless copper plating with subsequent copper electroplating. The vertical cross section of blind vias with diameters between 125 and 75 μm were analyzed by reflective microscopy. Results indicate that ultrasonic vibration during the pretreatment processes of metallization enables complete electroless copper deposition of the inside wall of the small blind vias without any voids. Furthermore, the introduction of periodic pulse reversal current for the subsequent copper electroplating process resulted in high throwing power deposition. By employing these two protocols, it has been demonstrated that high throwing power deposition can be readily achieved for blind vias as small as 75 μm in diameter with an aspect ratio of 3:1
  • Keywords
    electroless deposition; electroplating; metallisation; printed circuit manufacture; 75 to 125 micron; aspect ratio; blind vias; electroless plating; electroplating; laminate metallisation; periodic pulse reversal current; pretreatment processes; reflective microscopy; throwing power; ultrasonic vibration; Copper; Dielectrics; Integrated circuit interconnections; Laser ablation; Metallization; Nonhomogeneous media; Pulsed laser deposition; Scanning electron microscopy; Thermal resistance; Wiring;
  • fLanguage
    English
  • Journal_Title
    Electronics Packaging Manufacturing, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-334X
  • Type

    jour

  • DOI
    10.1109/6104.795855
  • Filename
    795855