Title :
Measurements of the Transient Electric and Magnetic Field Components in HV Laboratories IEEE Subcommittee on Digital Techniques in Electrical Measurements
Author :
Malewski, R. ; Corcoran, R.P. ; Feser, K. ; McComb, T.R. ; Nellis, C. ; Nourse, G.
Author_Institution :
IREQ
Keywords :
Circuit testing; Delay effects; Electric variables measurement; Frequency; Impulse testing; Instruments; Interference; Laboratories; Magnetic field measurement; Probability;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1982.5519964
