• DocumentCode
    1251539
  • Title

    Managing the Concurrent Execution of Dependent Product Development Stages

  • Author

    Lin, Jun ; Qian, Yanjun ; Cui, Wentian

  • Author_Institution
    Sch. of Manage., Xi´´an Jiaotong Univ., Xi´´an, China
  • Volume
    59
  • Issue
    1
  • fYear
    2012
  • Firstpage
    104
  • Lastpage
    114
  • Abstract
    Concurrent product development, the practice of executing dependent product development stages simultaneously, has become the common mode of new product development because of the increasing importance of time-to-market. However, such simultaneous execution of dependent stages may substantially increase the total amount of rework. This research addresses the trade-offs involved in concurrent process, presents analytical models to determine the optimal priority ordering of initial development and rework, and the optimal overlapping duration. We first show that initial development is prior to rework when learning effect is taken into account. Then, based on the general assumption of nonnegative upstream evolution and the clear definition of maximum concurrency, we prove that the total development cost (including rework cost and opportunity cost of time) is convex with respect to the overlapping duration, and so the optimal overlapping duration can be identified by a simple binary search. After that we investigate the Pareto-optimal overlapping strategies for the cases where budget is given or the time to market is predetermined. Finally, the methodology is illustrated with a case study at a handset design company.
  • Keywords
    Pareto optimisation; concurrent engineering; costing; product development; search problems; Pareto-optimal overlapping strategy; binary search; concurrent execution management; concurrent process; concurrent product development; dependent product development stage; handset design company; nonnegative upstream evolution; rework cost; total development cost; Analytical models; Companies; Computer crashes; Concurrent computing; Logic gates; Product development; Sensitivity; Concurrent engineering; new product development; overlapping; process modeling;
  • fLanguage
    English
  • Journal_Title
    Engineering Management, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9391
  • Type

    jour

  • DOI
    10.1109/TEM.2011.2132761
  • Filename
    5910376