• DocumentCode
    1251840
  • Title

    How does our n-component system perform?

  • Author

    Finkelstein, Maxim S.

  • Author_Institution
    Dept. of Math. Stat., Univ. of the Orange Free State, Bloemfontein, South Africa
  • Volume
    50
  • Issue
    4
  • fYear
    2001
  • fDate
    12/1/2001 12:00:00 AM
  • Firstpage
    414
  • Lastpage
    418
  • Abstract
    The statistical (black box) remaining lifetime of some simple coherent systems is stochastically compared with the remaining lifetime based on the information at hand. Parallel and cold standby systems of s-identical components with exponentially distributed lifetimes are considered. Information-based remaining lifetime is defined via the number of the nonfailed components at the moment of observation. The main question to answer is: Given the information on the current state of the system, is the remaining lifetime better (worse) in some stochastic sense than the remaining lifetime that is defined by the black box remaining lifetime? The result of this comparison for the general case depends on the time of observation and the time since observation. Several simple examples have been considered, because it is rather difficult technically to treat the stated problem in a greater generality. The main common feature of these examples, describing systems of s-identical components is the monotonically increasing system hazard-rate. An example with a nonmonotone hazard rate for a system of two different components has also been studied
  • Keywords
    failure analysis; reliability theory; statistical analysis; stochastic processes; black box remaining lifetime; component reliability; exponentially distributed lifetimes; monotonically increasing system hazard-rate; n-component system performance; observation; remaining lifetime; s-identical components; simple coherent systems; standby systems; statistical remaining lifetime; stochastic ordering; Africa; Distribution functions; Hazards; Helium; Information analysis; Inspection; Statistics; Stochastic processes; Stochastic systems;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/24.983404
  • Filename
    983404