Title :
Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost
Author :
Ishida, Makoto ; Ichiyama, Kiyotaka ; Fujibe, T. ; Watanabe, Daisuke ; Kawabata, Michitaka
Abstract :
This paper proposes a real-time testing method for multilevel signal interfaces. It utilizes multilevel drivers that can modulate both the voltage and timing of an output signal, and multilevel comparators based on a dynamic threshold concept. The authors also consider the impact on test cost of the proposed system and compares that cost with a conventional binary test system.
Keywords :
comparators (circuits); driver circuits; real-time systems; timing circuits; dynamic threshold concept; multilevel comparators; multilevel drivers; multilevel signal interfaces; output signal; real-time testing; test cost; timing modulation; voltage modulation; Jitter; Noise measurement; Real time systems; Receivers; Testing; Threshold voltage; Timing; jitter tolerance; multi-level signal interface; multi-level signal testing; voltage noise tolerance;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2012.2210382
