DocumentCode :
1252246
Title :
Microcantilever-based mass sensors: working at higher modes against reducing the dimensions
Author :
Lakshmoji, K. ; Prabakar, K. ; Kumar, Ajit ; Brijitta, J. ; Jayapandian, J. ; Tata, B.V.R. ; Tyagi, A.K. ; Sundar, C.S.
Author_Institution :
Mater. Sci. Group, Indira Gandhi Centre for Atomic Res., Kalpakkam, India
Volume :
7
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
613
Lastpage :
616
Abstract :
Enhanced sensitivity and quality factor of microcantilever (MC)-based mass sensors when working at higher modes and reducing the dimensions are compared. By analysing the out-of-plane vibration signals recorded using an atomic force microscopy head, seven unique modes of a low spring constant MC are identified and mode shapes are assigned with the help of finite element method simulations. Polymer coating on the MC is applied by a precise dip coating setup and shift in frequency because of added mass is used to estimate the mass sensitivity. Similar measurements were also carried out for different dimensions of MC. The authors found that mass sensitivity increases with increase of eigenvalue (λ2n) and decreasing dimensions (T/L2) where T is thickness and L is length of MC. Although mass sensitivity was found to enhance by either method, quality factor was found to decrease at higher modes after the addition of polymer mass.
Keywords :
atomic force microscopy; cantilevers; eigenvalues and eigenfunctions; finite element analysis; mass measurement; microsensors; polymer films; vibrations; MC-based mass sensor; atomic force microscopy; dip coating setup; eigenvalue; finite element method simulation; low spring constant MC; mass sensitivity estimation; microcantilever-based mass sensor; mode shape; out-of-plane vibration signal analysis; polymer coating; polymer mass; quality factor; sensitivity enhancement;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2012.0341
Filename :
6250090
Link To Document :
بازگشت