DocumentCode :
1252302
Title :
Improving the wear resistance of NiTi shape memory alloy thin films by nitrogen and carbon ion implantation
Author :
Gorji, M.R. ; Sanjabi, S. ; Barber, Z.H.
Author_Institution :
Nanomater. group, Dept. of Mater. Eng., Tarbiat Modares Univ., Tehran, Iran
Volume :
7
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
641
Lastpage :
645
Abstract :
Annealed NiTi thin films (~51.2~at.%Ni) were implanted with carbon and nitrogen ions with 80~keV energy and 3~1017 cm-2 ion dose. X-ray photoelectron spectroscopy confirmed the existence of implanted ions in the surface structure of the films. Atomic force microscopy showed an increase of roughness and decrease of grain size after ion implantation. Grazing incidence X-ray diffraction showed the formation of new phases in the films such as TiN, Ti2N, TiC and different kinds of oxides. Nanoindentation and nanoscratching tests revealed the improvement of wear behaviour of NiTi thin films after ion implantation via increasing nanohardness (3.1-6.2 and 7.3-GPa after carbon and nitrogen ion implantation, respectively) and decreasing of scratch coefficient (0.22-0.18 and 0.17 after carbon and nitrogen ion implantation) and wear depth.
Keywords :
X-ray diffraction; X-ray photoelectron spectra; annealing; atomic force microscopy; carbon; grain size; hardness; hardness testing; ion implantation; metallic thin films; nanoindentation; nickel alloys; nitrogen; shape memory effects; surface roughness; titanium alloys; wear resistance; NiTi:C; NiTi:N; X-ray photoelectron spectroscopy; annealing; atomic force microscopy; carbon ion implantation; electron volt energy 80 keV; grain size; grazing incidence X-ray diffraction; nanohardness; nanoindentation testing; nanoscratching testing; nitrogen ion implantation; shape memory alloy thin films; surface roughness; surface structure; wear resistance;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2012.0299
Filename :
6250098
Link To Document :
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