DocumentCode
1252345
Title
Differential RF MEMS interwoven capacitor immune to residual stress warping
Author
Elshurafa, A.M. ; Salama, Khaled N.
Author_Institution
Electr. Eng., King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia
Volume
7
Issue
7
fYear
2012
fDate
7/1/2012 12:00:00 AM
Firstpage
658
Lastpage
661
Abstract
A RF MEMS capacitor with an interwoven structure is designed, fabricated in the PolyMUMPS process and tested in an effort to address fabrication challenges usually faced in MEMS processes. The interwoven structure was found to offer several advantages over the typical MEMS parallel-plate design including eliminating the warping caused by residual stress, eliminating the need for etching holes, suppressing stiction, reducing parasitics and providing differential capability. The quality factor of the proposed capacitor was higher than five throughout a 2-10 GHz range and the resonant frequency was in excess of 20 GHz.
Keywords
Q-factor; capacitors; etching; internal stresses; microfabrication; micromechanical devices; MEMS processing; RF MEMS interwoven capacitor immune; etching holes; interwoven structure; polyMUMPS processing; quality factor; residual stress; residual stress warping; typical MEMS parallel-plate design;
fLanguage
English
Journal_Title
Micro & Nano Letters, IET
Publisher
iet
ISSN
1750-0443
Type
jour
DOI
10.1049/mnl.2012.0400
Filename
6250102
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