DocumentCode :
1252345
Title :
Differential RF MEMS interwoven capacitor immune to residual stress warping
Author :
Elshurafa, A.M. ; Salama, Khaled N.
Author_Institution :
Electr. Eng., King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia
Volume :
7
Issue :
7
fYear :
2012
fDate :
7/1/2012 12:00:00 AM
Firstpage :
658
Lastpage :
661
Abstract :
A RF MEMS capacitor with an interwoven structure is designed, fabricated in the PolyMUMPS process and tested in an effort to address fabrication challenges usually faced in MEMS processes. The interwoven structure was found to offer several advantages over the typical MEMS parallel-plate design including eliminating the warping caused by residual stress, eliminating the need for etching holes, suppressing stiction, reducing parasitics and providing differential capability. The quality factor of the proposed capacitor was higher than five throughout a 2-10 GHz range and the resonant frequency was in excess of 20 GHz.
Keywords :
Q-factor; capacitors; etching; internal stresses; microfabrication; micromechanical devices; MEMS processing; RF MEMS interwoven capacitor immune; etching holes; interwoven structure; polyMUMPS processing; quality factor; residual stress; residual stress warping; typical MEMS parallel-plate design;
fLanguage :
English
Journal_Title :
Micro & Nano Letters, IET
Publisher :
iet
ISSN :
1750-0443
Type :
jour
DOI :
10.1049/mnl.2012.0400
Filename :
6250102
Link To Document :
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