• DocumentCode
    1252345
  • Title

    Differential RF MEMS interwoven capacitor immune to residual stress warping

  • Author

    Elshurafa, A.M. ; Salama, Khaled N.

  • Author_Institution
    Electr. Eng., King Abdullah Univ. of Sci. & Technol. (KAUST), Thuwal, Saudi Arabia
  • Volume
    7
  • Issue
    7
  • fYear
    2012
  • fDate
    7/1/2012 12:00:00 AM
  • Firstpage
    658
  • Lastpage
    661
  • Abstract
    A RF MEMS capacitor with an interwoven structure is designed, fabricated in the PolyMUMPS process and tested in an effort to address fabrication challenges usually faced in MEMS processes. The interwoven structure was found to offer several advantages over the typical MEMS parallel-plate design including eliminating the warping caused by residual stress, eliminating the need for etching holes, suppressing stiction, reducing parasitics and providing differential capability. The quality factor of the proposed capacitor was higher than five throughout a 2-10 GHz range and the resonant frequency was in excess of 20 GHz.
  • Keywords
    Q-factor; capacitors; etching; internal stresses; microfabrication; micromechanical devices; MEMS processing; RF MEMS interwoven capacitor immune; etching holes; interwoven structure; polyMUMPS processing; quality factor; residual stress; residual stress warping; typical MEMS parallel-plate design;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2012.0400
  • Filename
    6250102