• DocumentCode
    1252377
  • Title

    In situ observation of structural rearrangement of a Cu nanotwin particle

  • Author

    Baoqin Shi ; Chunwang Zhao ; Fei Liu

  • Author_Institution
    Coll. of Sci., Inner Mongolia Univ. of Technol., Hohhot, China
  • Volume
    7
  • Issue
    7
  • fYear
    2012
  • fDate
    7/1/2012 12:00:00 AM
  • Firstpage
    676
  • Lastpage
    678
  • Abstract
    Cu nanotwin particles were successfully obtained on SiO2 films through Ar ion beam to bombard the copper transmission electron microscopy (TEM) grid. The structural rearrangement of a large Cu nanotwin particle was observed in situ using high-resolution TEM under long-time electron beam irradiation. The rotation of the whole nanotwin particle was also observed. The Cu nanotwin particle possessed some independent subgrains. The crystal facets of the subgrains tended to be parallel to each other after rearrangement during electron beam irradiation. The deformation of the Cu nanotwin particle started from the central subgrains to the side subgrains. Structural rearrangement in single subgrain occurred in the opposite direction, from outside to inside. Strain fields in Cu nanotwin particle was mapped using geometric phase analysis, which displayed the decrease in the space between crystal facets and the change from tensile strain to compressive strain.
  • Keywords
    compressive strength; copper; deformation; electron beam effects; ion beam effects; nanofabrication; nanoparticles; tensile strength; transmission electron microscopy; Ar ion beam irradiation; Cu; SiO2; SiO2 films; TEM; compressive strain; copper nanotwin particle; crystal facets; deformation; geometric phase analysis; high-resolution transmission electron microscopy; long-time electron beam irradiation; strain fields; structural rearrangement; subgrains; tensile strain;
  • fLanguage
    English
  • Journal_Title
    Micro & Nano Letters, IET
  • Publisher
    iet
  • ISSN
    1750-0443
  • Type

    jour

  • DOI
    10.1049/mnl.2012.0295
  • Filename
    6250106