DocumentCode :
1252605
Title :
Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz
Author :
Jen, Steve Hung-Min ; Enz, Christian C. ; Pehlke, David R. ; Schröter, Michael ; Sheu, Bing J.
Author_Institution :
IC Media Corp., Santa Clara, CA, USA
Volume :
46
Issue :
11
fYear :
1999
fDate :
11/1/1999 12:00:00 AM
Firstpage :
2217
Lastpage :
2227
Abstract :
Accurate modeling and efficient parameter extraction of the small signal equivalent circuit of submicrometer MOS transistors for high-frequency operation are presented. The equivalent circuit is based on a quasi-static approximation which was found to be adequate in the gigahertz range if the extrinsic components are properly modeled. It includes the complete intrinsic quasi-static MOS model, the series resistances of gate, source, and drain, and a substrate coupling network. Direct extraction is performed by Y-parameter analysis on the equivalent circuit in the linear and saturation regions of operation. The extracted results are physically meaningful and can be used to “de-embed” the extrinsic effects such as the substrate coupling within the device. Good agreement has been obtained between the simulation results of the equivalent circuit and measured data up to 10 GHz
Keywords :
MOSFET; equivalent circuits; semiconductor device models; 10 GHz; RF MOSFET; Y-parameter analysis; de-embedding; high-frequency operation; model; parameter extraction; quasi-static approximation; small-signal equivalent circuit; submicrometer MOS transistor; substrate coupling; Circuit simulation; Coupling circuits; Equivalent circuits; Integrated circuit measurements; MOSFETs; Parameter extraction; Performance analysis; Radio frequency; Semiconductor device modeling; Substrates;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.796299
Filename :
796299
Link To Document :
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