• DocumentCode
    1252734
  • Title

    Noniterative stable transmission/reflection method for low-loss material complex permittivity determination

  • Author

    Boughriet, Abdel-Hakim ; Legrand, Christian ; Chapoton, Alain

  • Author_Institution
    Dept. Hyperfrequences et Semicond., Univ. des Sci. et Tech., Villeneuve d´´Ascq, France
  • Volume
    45
  • Issue
    1
  • fYear
    1997
  • fDate
    1/1/1997 12:00:00 AM
  • Firstpage
    52
  • Lastpage
    57
  • Abstract
    This paper describes a new noniterative transmission/reflection method applicable to permittivity measurements using arbitrary sample lengths in wide-band frequencies. This method is based on a simplified version of the well-known Nicolson-Ross-Weir (NRW) method. For low-loss materials, this method is stable over the whole frequency range: no divergence is observed at frequencies corresponding to integer multiples of one half wavelength in the sample. The accuracy on the dielectric permittivity is similar to that obtained with a more recently proposed iterative technique. A general equation for complex permittivity determination including the Stuchly, NRW, and new noniterative methods, is also proposed
  • Keywords
    coaxial waveguides; dielectric-loaded waveguides; microwave measurement; permittivity measurement; rectangular waveguides; Nicolson-Ross-Weir method; Stuchly methods; complex permittivity determination; dielectric permittivity; low-loss material; microwave measurement; noniterative methods; permittivity measurements; stable transmission/reflection method; Coaxial components; Dielectric materials; Electromagnetic measurements; Electromagnetic reflection; Electromagnetic scattering; Electromagnetic waveguides; Frequency; Permittivity measurement; Scattering parameters; Wideband;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/22.552032
  • Filename
    552032