Title :
Characterizations of Gamma and negative binomial distributions [reliability application]
Author :
Osaki, Shunji ; Li, Xin-xiang
Author_Institution :
Hiroshima Univ., Japan
fDate :
10/1/1988 12:00:00 AM
Abstract :
Characterizations of gamma and negative binomial distributions are presented by using the conditional expectation. A necessary and sufficient condition is given in terms of the failure rate for each distribution. To illustrate the usefulness of the results, the authors discuss the mean residual-life of the gamma distribution
Keywords :
failure analysis; reliability theory; statistical analysis; conditional expectation; failure rate; gamma distribution; mean residual-life; negative binomial distributions; reliability; statistics; Equations; Exponential distribution; Hazards; Probability; Reliability theory; Statistical distributions; Sufficient conditions;
Journal_Title :
Reliability, IEEE Transactions on
